These texts discuss various analytical techniques, including electron microprobe analysis (EPMA is most used by geochemists, and some of the best reviews are in that field). They are appropriate for the novice.
AUTHOR Potts, P. J.
TITLE A handbook of silicate rock analysis / P.J. Potts.
AUTHOR Zussman, J.
TITLE Physical methods in determinative mineralogy / edited by J. Zussman.
EDITION 2d ed.
Scanning Electron Microscopy and X-ray Microanalysis (A Text for Biologists, Materials Scientists, and Geologists) is the single best reference for scanning electron microscopy and x-ray microanalysis. All users of the scanning electron microscope and electron microprobe should read the pertinent chapters from this text. Your research group should purchase a copy that can be shared among users of the facility. The second edition is generally better than the first edition, but some material did not make the transition; see the first edition if you want the whole picture.
Goldstein, et al., Scanning Electron Microscopy and X-ray Microanalysis (A Text for Biologists, Materials Scientists, and Geologists), 2nd ed. New York: Plenum Press, 1992
Chapter 2 Electron Optics
Chapter 3 Electron - Specimen
Interactions
Chapter 4 Image Formation and Interpretation
Chapter 5 X-ray
Spectral
Measurement: WDS and EDS
Chapter 6 Qualitative X-ray Analysis
Chapter 7
X-ray Peak and Background Measurements
Chapter 8 Quantitative X-ray
Analysis: The Basics
Chapter 9 Quantitative X-ray Analysis: Theory
and
Practice
Chapter 10 Compositional Imaging
Chapter 11 Specimen
Preparation for Inorganic Materials: Microstructural and Microchemical
Analysis
Chapter 12 Sample Preparation for Biological, Organic, Polymeric,
and
Hydrated Materials
Chapter 13 Coating and Conductivity Techniques
for SEM
and Microanalysis
Chapter 14 Database
LOCATIONS Earth & Planet Sci Lib
OCLC # 25551671.
OCLC # 26765896.
TITLE Scanning electron microscopy and X-ray microanalysis : a text for
biologists, materials scientists, and geologists / Joseph I.
Goldstein ... [et al.]
EDITION 2nd ed.
PUBLISHED New York : Plenum Press, c1992.
DESCRIPTION xviii, 820 p. : ill. ; 26 cm.
BIBLIOGRAPHY Includes bibliographical references (p. 787-805) and index.
SUBJECTS Scanning electron microscopy.
SUBJECTS X-ray microanalysis.
OTHER AUTHOR Goldstein, Joseph, 1939-
ISBN 0306441756.
1 > E&PSc General Stacks QH212 S3 S315 1992
Advanced scanning electron microscopy and X-ray microanalysis
LOCATIONS Biology Library
OCLC # 12907061.
TITLE Advanced scanning electron microscopy and X-ray microanalysis /
Dale Newbury ... [et al.]
PUBLISHED New York : Plenum Press, c1986.
DESCRIPTION xii, 454 p., [4] p. of plates : ill. (some col.) ; 24 cm.
NOTE Includes index.
BIBLIOGRAPHY Bibliography: p. 435-448.
SUBJECTS Scanning electron microscopes.
SUBJECTS X-ray microanalysis.
OTHER AUTHOR Newbury, Dale E.
ISBN 0306421402.
1 > Biol General Stacks QH212 S3 A24 1986 NOT CHECKD OUT
Scanning and transmission electron microscopy: an introduction is another general reference for electron microscopy. It is written with the TEM in mind and does not go into the detail that Goldstein et al does. It is appropriate for those who do not understand anything in the Goldstein text.
Flegler, et al., Scanning and transmission electron microscopy: an introduction. Oxford: Oxford University Press, 1994.
AUTHOR Flegler, Stanley L.
TITLE Scanning and transmission electron microscopy : an introduction / Stanley
L. Flegler, John W. Heckman, Jr., Karen L. Klomparens.
The Reimer text Scanning electron microscopy : physics of image formation and microanalysis discusses the physics of imaging and microanslysis, and approaches the subject in a elegant but terse manner. It is at the same or more advanced level than the Goldstein text.
AUTHOR Reimer, Ludwig, 1928-
TITLE Scanning electron microscopy : physics of image formation and microanalysis
/ Ludwig Reimer.
Images of Materials offers examples of images collected by various techniques.
TITLE Images of materials / edited by David B. Williams, Alan R.
Pelton,
Ronald Gronsky ; with a foreword by Peter B. Hirsch.
IMPRINT New York : Oxford University Press, 1991.
Quantitative electron-probe microanalysis is a good text on aspects of quantitative microanalysis, and goes into more detail than Goldstein et al. It covers ZAF and PRZ correction schemes.
LOCATIONS Chemistry Library
OCLC # 32005349.
AUTHOR Scott, V. D. (Victor D.), 1928-
TITLE Quantitative electron-probe microanalysis / V.D. Scott, G. Love,
S.J.B. Reed.
EDITION 2nd ed.
PUBLISHED New York : Ellis Horwood, 1995.
DESCRIPTION xiv, 311 p. : ill. ; 24 cm.
SERIES Ellis Horwood series in physics and its applications.
NOTE Previous ed.: 1983.
BIBLIOGRAPHY Includes bibliographic references (p. 285-303) and index.
SUBJECTS Electron probe microanalysis.
SUBJECTS Microchemistry.
SUBJECTS Chemistry, Analytic -- Quantitative.
OTHER AUTHOR Love, G. (Glyn), 1946-
OTHER AUTHOR Reed, S. J. B.
ISBN 0131040502.
1 > Chem General Stacks QD117 E42 S39 1995
Microprobe techniques in the earth sciences / edited by Philip J. Potts
... [et al.]
LOCATIONS Earth & Planet Sci Lib
OCLC # 32873838.
TITLE Microprobe techniques in the earth sciences / edited by Philip J. Potts
... [et al.]
EDITION 1st ed.
PUBLISHED London ; New York : Chapman & Hall, 1995.
DESCRIPTION xi, 419 p. : ill. ; 24 cm.
SERIES Mineralogical Society series ; 6.
BIBLIOGRAPHY Includes bibliographical references and index.
SUBJECTS Earth sciences -- Research.
SUBJECTS Microprobe analysis -- Technique.
OTHER AUTHOR Potts, P. J.
OTHER AUTHOR Bowles, John F. W.
OTHER AUTHOR Reed, S. J. B.
OTHER AUTHOR Cave, Mark R.
OTHER AUTHOR Mineralogical Society (Great Britain)
ISBN 0412551004.
1 > E&PSc General Stacks QE33.2.M5 M53 1995
An introduction to X-ray spectrometry : X-ray fluorescence and electron microprobe analysis is a relatively good text which discusses both instrumentation and quantitation aspects of microanalysis (and related aspects of x-ray fluorescence).
LOCATIONS Earth & Planet Sci Lib
OCLC # 15414990.
AUTHOR Williams, K. L.
TITLE An introduction to X-ray spectrometry : X-ray fluorescence and
electron microprobe analysis / K.L. Williams.
PUBLISHED London ; Boston : Allen & Unwin, 1987.
DESCRIPTION xiii, 370 p. : ill. ; 24 cm.
NOTE Includes index.
BIBLIOGRAPHY Bibliography: p. 364-366.
SUBJECTS Rocks -- Analysis.
SUBJECTS Mineralogy, Determinative.
SUBJECTS X-ray spectroscopy.
SUBJECTS Fluorescence spectroscopy.
SUBJECTS Microprobe analysis.
ISBN 0045440018 (alk. paper)
1 > E&PSc General Stacks QE435 W55 1987
2 > E&PSc General Stacks QE435 W55 1987 c.2
Electron probe quantitation is a collection of papers that discuss the state-of-the-art of microprobe analysis. It is new. It is not an introductory text.
TITLE Electron probe quantitation / edited by K.F.J. Heinrich and Dale E. Newbury.
IMPRINT New York : Plenum Press, c1991.
X-ray spectrometry in electron beam instruments
LOCATIONS Physics Library
OCLC # 31782404.
TITLE X-ray spectrometry in electron beam instruments / edited by David
B. Williams, Joseph I. Goldstein, and Dale E. Newbury.
PUBLISHED New York : Plenum Press, c1995.
DESCRIPTION xviii, 372 p. : ill. ; 26 cm.
BIBLIOGRAPHY Includes bibliographical references and index.
SUBJECTS Electron beams -- Instruments.
SUBJECTS X-ray spectroscopy.
SUBJECTS Electron probe microanalysis.
OTHER AUTHOR Williams, David B. (David Bernard), 1949-
OTHER AUTHOR Goldstein, Joseph, 1939-
OTHER AUTHOR Newbury, Dale E.
ISBN 0306448580.
1 > Phys General Stacks QC793.5 E622 X14 1995
Electron Microprobe Analysis by SJB Reed
LOCATIONS Chemistry Library & Earth & Planet Sci Lib & Physics
Library
OCLC # 25832163.
AUTHOR Reed, S. J. B.
TITLE Electron microprobe analysis / S. J. B. Reed.
EDITION 2nd ed.
PUBLISHED Cambridge ; New York : Cambridge University Press, 1993.
DESCRIPTION xviii, 326 p., 3 p. of plates : ill. (some col.) ; 24 cm.
BIBLIOGRAPHY Includes bibliographical references (p. 306-318) and index.
SUBJECTS Microprobe analysis.
ISBN 0521419565.
1 > Chem General Stacks QD117 E42 R43 1993
2 > E&PSc General Stacks QD117 E42 R43 1993
3 > Phys General Stacks QD117 E42 R43 1993
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
by SJB Reed
LOCATIONS Earth & Planet Sci Lib
OCLC # 60419337.
AUTHOR Reed, S. J. B.
TITLE Electron microprobe analysis and scanning electron microscopy in
geology / S.J.B. Reed.
EDITION 2nd ed.
PUBLISHED Cambridge : Cambridge University Press, c2005.
DESCRIPTION xiii, 189 p., [8] p. of plates : ill., (some col.), charts ; 26
cm.
NOTE Previous ed.: 1996.
BIBLIOGRAPHY Includes bibliographical references (p. 179-186) and index.
SUBJECTS Petrofabric analysis.
SUBJECTS Electron probe microanalysis.
SUBJECTS Scanning electron microscopy.
ISBN 052184875X.
STANDARD # 9780521848756.
1 > E&PSc General Stacks QE440 .R43 2005
Electron beam x-ray microanalysis / Kurt F. J. Heinrich
LOCATIONS Chemistry Library
OCLC # 6043433.
AUTHOR Heinrich, Kurt F. J.
TITLE Electron beam x-ray microanalysis / Kurt F. J. Heinrich.
PUBLISHED New York : Van Nostrand Reinhold Co., c1981.
DESCRIPTION xxiii, 578 p., [4] leaves of plates : ill. (some col.) ; 24 cm.
BIBLIOGRAPHY Includes bibliographical references and indexes.
SUBJECTS Electron probe microanalysis.
SUBJECTS X-ray spectroscopy.
ISBN 0442232861.
1 > Chem General Stacks QD98 E4 H44
Microanalysis of solids
LOCATIONS Earth & Planet Sci Lib
OCLC # 29313483.
TITLE Microanalysis of solids / edited by B.G. Yacobi, D.B. Holt, and
L.L. Kazmerski.
PUBLISHED New York : Plenum Press, c1993.
DESCRIPTION xiii, 460 p. : ill. ; 24 cm.
BIBLIOGRAPHY Includes bibliographical references and index.
SUBJECTS Microchemistry.
SUBJECTS Solids -- Analysis.
OTHER AUTHOR Yacobi, B. G.
OTHER AUTHOR Holt, D. B.
OTHER AUTHOR Kazmerski, Lawrence L.
ISBN 030644433X.
1 > E&PSc General Stacks QD79 M5 M53 1993 NOT CHECKD OUT
Fundamentals of Energy Dispersive X-ray Analysis is an introduction to EDS and offers an in-depth discussion of the instrument and its pros and cons. It is enlightening for the novice and should be read for those sem users who do EDS analysis.
AUTHOR Russ, John C.
TITLE Fundamentals of energy dispersive
x-ray
analysis / John C. Russ.
Microbeam Analysis are the proceedings volumes of the annual meeting of the Microbeam Analysis Society. These volumes contain almost all research papers (as extended abstracts) concerning various aspects of electron microprobe analysis. A bibliographic database of papers from these proceedings is under construction.
LOCATIONS Chemistry Library & Earth & Planet Sci Lib & West Campus
Library
OCLC # 7246538.
CORP AUTH Microbeam Analysis Society. Conference.
TITLE Microbeam analysis.
PUBLISHED San Francisco, Calif. : San Francisco Press, c1979-
DESCRIPTION v. : ill. ; 29 cm.
FREQUENCY Annual.
PUB HISTORY 1979-
NOTE Proceedings of the Annual Conference of the Microbeam Analysis
Society.
NOTE Editors vary.
NOTE 29th (1995)- published: New York : VCH Publishers.
SUBJECTS Electron probe microanalysis -- Congresses.
SUBJECTS Microprobe analysis -- Congresses.
OTHER AUTHOR Microbeam Analysis Society.
OTHER TITLE Microbeam anal.
CONTINUES Microbeam Analysis Society. Conference. Annual conference of the
Microbeam Analysis Society 0146-6275.
ISSN 0278-1727 0146-6725.
CODEN MBANDD.
1 > Chem General Stacks QD98 E4 M5 1986 (21st)
2 > Chem General Stacks QD98 E4 M5 1987 (22nd)
3 > Chem General Stacks QD98 E4 M5 1995 (29th)
4 > E&PSc General Stacks QD98 E4 M5 1979 (14th)
5 > WestC General Stacks QD98 E4 M5 1988 (23rd)
The CITZAF X-ray Correction Program is used in our laboratory to convert x-ray intensity to concentration units, as well as for other more detailed calculations. We usually use the Armstrong PRZ algorithm for our data correction. The CalcZAF program written by John Donovan is a very nice update to the core CITZAF correction routines and is freely available.
Here is the reference you should use:
CITZAF: A Package of Correction Programs for the Quantitative Electron Microbeam X-ray Analysis of Thick Polished Materials, Thin Films, and Particles, John T. Armstrong, Microbeam Analysis, 4 (1995), 177-200.
The best reference currently available for geologists is Modern Powder Diffraction, volume 20 of the MSA Reviews in Mineralogy. It is a good starting point for many topics including Rietveld analysis.
TITLE Modern powder diffraction / D.L. Bish and J.E. Post, editors.
IMPRINT Washington, D.C. : Mineralogical Society of America, c1989.
X-ray diffraction procedures for polycrystalline and amorphous materials is an in-depth reference that covers some aspects of x-ray diffraction in greater depth than the previous reference.
AUTHOR Klug, Harold Philip, 1902-
TITLE X-ray diffraction procedures for polycrystalline and amorphous
materials [by] Harold P. Klug [and] Leroy E. Alexander.
X-ray fluorescence analysis in the geological sciences : advances in methodology discusses x-ray fluorescence spectrometry and analysis with a particular emphasis on EDSXRF techniques.
TITLE X-ray fluorescence analysis in the geological sciences :
advances
in methodology / S.T. Ahmedali, editor ; contributors, S. Abbey [et al.]
Advances in x-ray analysis : proceedings of the annual Conference on Application of X-ray Analysis are the proceedings of an annual conference on x-ray analysis. These volumes contain older papers on x-ray analysis.
AUTHOR Conference on Application of X-ray Analysis.
TITLE
Advances in
x-ray analysis : proceedings of the annual Conference on Application of
X-ray
Analysis.